Obert, James: search on Z-Library

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1

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Extreme Ultraviolet (EUV) Lithography VI - Low-LER tin carboxylate photoresists using EUV

Wood, Obert R., Panning, Eric M., Del Re, Ryan, Sortland, Miriam, Pasarelli, James, Cardineau, Brian, Ekinci, Yasin, Vockenhuber, Michaela, Neisser, Mark, Freedman, Daniel, Brainard, Robert L.

Year:

2015

Language:

english

File:

PDF, 12.39 MB

english, 2015

2

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Extreme Ultraviolet (EUV) Lithography V - Investigation of novel inorganic resist materials for EUV lithography

Wood, Obert R., Panning, Eric M., Krysak, Marie E., Blackwell, James M., Putna, Steve E., Leeson, Michael J., Younkin, Todd R., Harlson, Shane, Frasure, Kent, Gstrein, Florian

Year:

2014

Language:

english

File:

PDF, 1.92 MB

english, 2014

3

[IEEE 2018 17th IEEE International Conference On Trust, Security And Privacy In Computing And Communications/ 12th IEEE International Conference On Big Data Science And Engineering (TrustCom/BigDataSE) - New York, NY, USA (2018.8.1-2018.8.3)] 2018 17th IEEE International Conference On Trust, Security And Privacy In Computing And Communications/ 12th IEEE International Conference On Big Data Science And Engineering (TrustCom/BigDataSE) - Behavioral Based Trust Metrics and the Smart Grid

Obert, James, Chavez, Adrian, Johnson, Jay

Year:

2018

Language:

english

File:

PDF, 324 KB

english, 2018

4

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Extreme Ultraviolet (EUV) Lithography III - 3D mask modeling for EUV lithography

Mailfert, Julien, Zuniga, Christian, Philipsen, Vicky, Adam, Konstantinos, Lam, Michael, Word, James, Hendrickx, Eric, Vandenberghe, Geert, Smith, Bruce, Naulleau, Patrick P., Wood II, Obert R.

Year:

2012

Language:

english

File:

PDF, 2.68 MB

english, 2012

5

Bi-Radial Curvature Morphology of the Healthy Talus

Myerson, Mark, Clancy, James, Paxson, Bob, Obert, Richard, Anderle, Mathew, Brinker, Laura, Daniel Lee, Eng M.

Journal:

Foot & Ankle Orthopaedics

Year:

2019

Language:

english

File:

PDF, 116 KB

english, 2019

6

Bi-Radial Curvature Morphology of the Healthy Talus

Myerson, Mark, Clancy, James, Paxson, Bob, Obert, Richard, Anderle, Mathew, Brinker, Laura, Daniel Lee, Eng M.

Journal:

Foot & Ankle Orthopaedics

Year:

2019

File:

PDF, 116 KB

2019

7

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Extreme Ultraviolet (EUV) Lithography VI - Implementation of assist features in EUV lithography

Wood, Obert R., Panning, Eric M., Jiang, Fan, Burkhardt, Martin, Raghunathan, Ananthan, Torres, Andres, Gupta, Rachit, Word, James

Year:

2015

Language:

english

File:

PDF, 1021 KB

english, 2015

8

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Extreme Ultraviolet (EUV) Lithography III - Insertion strategy for EUV lithography

Wood, Obert, Arnold, John, Brunner, Timothy, Burkhardt, Martin, Chen, James H.-C., Civay, Deniz, Fan, Susan S.-C., Gallagher, Emily, Halle, Scott, He, Ming, Higgins, Craig, Kato, Hirokazu, Kye, Jongwo

Year:

2012

Language:

english

File:

PDF, 3.03 MB

english, 2012

9

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Extreme Ultraviolet (EUV) Lithography III - Pattern collapse mitigation strategies for EUV lithography

Goldfarb, Dario L., Bruce, Robert L., Bucchignano, James J., Klaus, David P., Guillorn, Michael A., Wu, Chunghsi J., Naulleau, Patrick P., Wood II, Obert R.

Year:

2012

Language:

english

File:

PDF, 3.57 MB

english, 2012

10

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 23 February 2014)] Extreme Ultraviolet (EUV) Lithography V - Understanding EUV resist mottling leading to better resolution and linewidth roughness

Wood, Obert R., Panning, Eric M., Thackeray, James, Cameron, James, Jain, Vipul, LaBeaume, Paul, Coley, Suzanne, Ongayi, Owendi, Wagner, Mike, Biafore, John, Chun, Jun Sung

Year:

2014

Language:

english

File:

PDF, 811 KB

english, 2014

11

Movements of brown bullheads in Presque Isle Bay, Lake Erie, Pennsylvania

Michael J. Millard, David R. Smith, Eric Obert, James Grazio, Meredith L. Bartron, Colleen Wellington, Sara Grisè, Sean Rafferty, Robert Wellington, Shannon Julian

Journal:

Journal of Great Lakes Research

Year:

2009

Language:

english

File:

PDF, 336 KB

english, 2009

12

SPIE Proceedings [SPIE SPIE'S 1993 Symposium on Microlithography - San Jose, CA (Sunday 28 February 1993)] Electron-Beam, X-Ray, and Ion-Beam Submicrometer Lithographies for Manufacturing III - Soft x-ray (14 nm) lithography with ultrathin imaging layers and selective electroless metallization

Calvert, Jeffrey M., Koloski, Tim S., Dressick, Walter J., Dulcey, Charles S., Peckerar, Martin C., Cerrina, Franco, Taylor, James W., Suh, Doowon, Wood II, Obert R., MacDowell, Alastair A., D'Souza,

Year:

1993

Language:

english

File:

PDF, 819 KB

english, 1993

13

[IEEE 2019 Second International Conference on Artificial Intelligence for Industries (AI4I) - Laguna Hills, CA, USA (2019.9.25-2019.9.27)] 2019 Second International Conference on Artificial Intelligence for Industries (AI4I) - Graph-Based Event Classification in Grid Security Gateways

Obert, James, Chavez, Adrian

Year:

2019

File:

PDF, 284 KB

2019

14

[IEEE 2018 First International Conference on Artificial Intelligence for Industries (AI4I) - Laguna Hills, CA, USA (2018.9.26-2018.9.28)] 2018 First International Conference on Artificial Intelligence for Industries (AI4I) - Semi-Supervised Learning and ASIC Path Verification

Obert, James, Mannos, Tom J.

Year:

2018

Language:

english

File:

PDF, 317 KB

english, 2018

15

Proactively applied encryption in multipath networks

Obert, James, Pivkina, Inna, Huang, Hong, Cao, Huiping

Journal:

Computers & Security

Year:

2016

Language:

english

File:

PDF, 3.53 MB

english, 2016

16

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 23 February 2014)] Extreme Ultraviolet (EUV) Lithography V - Feasibility of compensating for EUV field edge effects through OPC

Wood, Obert R., Panning, Eric M., Maloney, Chris, Word, James, Fenger, Germain L., Niroomand, Ardavan, Lorusso, Gian F., Jonckheere, Rik, Hendrickx, Eric, Smith, Bruce W.

Year:

2014

Language:

english

File:

PDF, 7.89 MB

english, 2014

17

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optomechanical Engineering 2013 - Design of bipod flexure mounts for the IRIS spectrometer

Weingrod, Isaac, Chou, Catherine Y., Holmes, Buck, Hom, Craig, Irwin, James Wes, Lindstrom, Obert, Lopez, Frank, Stubbs, David M., Wüelser, Jean-Pierre, Hatheway, Alson E.

Year:

2013

Language:

english

File:

PDF, 807 KB

english, 2013

18

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Extreme Ultraviolet (EUV) Lithography VI - Extending resolution limits of EUV resist materials

Wood, Obert R., Panning, Eric M., Krysak, Marie, Leeson, Michael, Han, Eungnak, Blackwell, James, Harlson, Shane

Year:

2015

Language:

english

File:

PDF, 9.01 MB

english, 2015

19

The Composition of Grain and Forage from Glyphosate Tolerant Wheat MON 71800 Is Equivalent to That of Conventional Wheat ( Triticum aestivum L. )

Obert, Janet C., Ridley, William P., Schneider, Ronald W., Riordan, Susan G., Nemeth, Margaret A., Trujillo, William A., Breeze, Matthew L., Sorbet, Roy, Astwood, James D.

Journal:

Journal of Agricultural and Food Chemistry

Year:

2004

Language:

english

File:

PDF, 81 KB

english, 2004

20

Composition of Grain and Forage from Corn Rootworm-Protected Corn Event MON 863 Is Equivalent to That of Conventional Corn ( Zea mays L.)

George, Cherian, Ridley, William P., Obert, Janet C., Nemeth, Margaret A., Breeze, Matthew L., Astwood, James D.

Journal:

Journal of Agricultural and Food Chemistry

Year:

2004

Language:

english

File:

PDF, 79 KB

english, 2004

21

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Extreme Ultraviolet (EUV) Lithography III - Comparison of EUV and e-beam lithographic technologies for sub-22-nm node patterning

Cameron, James, Naulleau, Patrick P., Wood II, Obert R., Thackeray, Jim, Sung, Jin Wuk, Coley, Suzanne M., Jain, Vipul, Ongayi, Owendi, Wagner, Mike D., LaBeaume, Paul, Kwok, Amy, Valeri, David, Helli

Year:

2012

Language:

english

File:

PDF, 3.13 MB

english, 2012

22

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Extreme Ultraviolet (EUV) Lithography VI - Positive-tone EUV resists: complexes of platinum and palladium

Wood, Obert R., Panning, Eric M., Sortland, Miriam, Del Re, Ryan, Passarelli, James, Hotalen, Jodi, Vockenhuber, Michaela, Ekinci, Yasin, Neisser, Mark, Freedman, Daniel, Brainard, Robert L.

Year:

2015

Language:

english

File:

PDF, 799 KB

english, 2015

23

A multi-site comparison of psychosocial approaches for the treatment of methamphetamine dependence

Richard A. Rawson, Patricia Marinelli-Casey, M. Douglas Anglin, Alice Dickow, Yvonne Frazier, Cheryl Gallagher, Gantt P. Galloway, James Herrell, Alice Huber, Michael J. McCann, Jeanne Obert, Susan

Journal:

Year:

2004

Language:

english

File:

PDF, 128 KB

english, 2004

24

A historical perspective on the “fish tumors or other deformities” beneficial use impairment at Great Lakes Areas of Concern

Sean D. Rafferty, Vicki S. Blazer, Alfred E. Pinkney, James L. Grazio, Eric C. Obert, Lori Boughton

Journal:

Journal of Great Lakes Research

Year:

2009

Language:

english

File:

PDF, 241 KB

english, 2009

25

[IEEE 2012 IEEE/IFIP 42nd International Conference on Dependable Systems and Networks Workshops (DSN-W) - Boston, MA, USA (2012.06.25-2012.06.28)] IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN 2012) - Utilizing linear subspaces to improve cloud security

Zage, David, Obert, James

Year:

2012

Language:

english

File:

PDF, 623 KB

english, 2012

26

SPIE Proceedings [SPIE 26th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 25 February 2001)] Optical Microlithography XIV - Printing high-density patterns with dark-field 193-nm lithography

Wood II, Obert R., White, Donald L., Tennant, Donald M., Cirelli, Raymond A., Sweeney, James R., Blakey, Myrtle I., Griffith, Joseph E., Progler, Christopher J.

Year:

2001

Language:

english

File:

PDF, 2.22 MB

english, 2001

27

ASIC STA Path Verification Using Semi-Supervised Learning

Obert, James, Mannos, Tom J.

Journal:

International Journal of Semantic Computing

Year:

2019

Language:

english

File:

PDF, 785 KB

english, 2019

28

Defective activation of the pyruvate dehydrogenase complex in subacute necrotizing encephalomyelopathy (leigh disease)

Dr Darryl C. Devivo, Morey W. Haymond, Kathleen A. Obert, James S. Nelson, Anthony S. Pagliara

Journal:

Annals of Neurology

Year:

1979

Language:

english

File:

PDF, 1.60 MB

english, 1979

29

[IEEE 2014 IEEE Military Communications Conference (MILCOM) - Baltimore, MD, USA (2014.10.6-2014.10.8)] 2014 IEEE Military Communications Conference - Dynamically Differentiated Multipath Security in Fixed Bandwidth Networks

Obert, James, Pivkina, Inna, Huang, Hong, Cao, Huiping

Year:

2014

Language:

english

File:

PDF, 340 KB

english, 2014

30

[IEEE 2018 First International Conference on Artificial Intelligence for Industries (AI4I) - Laguna Hills, CA, USA (2018.9.26-2018.9.28)] 2018 First International Conference on Artificial Intelligence for Industries (AI4I) - Semi-Supervised Learning and ASIC Path Verification

Obert, James, Mannos, Tom J.

Year:

2018

File:

PDF, 317 KB

2018

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